1 - 5 of 5 results for "Manoj Sachdev"

Title: Thermal and Power Management of Integrated Circuits / Edition 1, Author: Arman Vassighi
Title: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits / Edition 2, Author: Manoj Sachdev
Title: ESD Protection Device and Circuit Design for Advanced CMOS Technologies / Edition 1, Author: Oleg Semenov
Title: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test / Edition 1, Author: Andrei Pavlov
Paperback $143.99 $159.99 Current price is $143.99, Original price is $159.99.
Title: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, Author: Manoj Sachdev