Title: Stress-Induced Phenomena in Metallization: Tenth International Workshop on Stress-Induced Phenomena in Metallization / Edition 1, Author: Paul S. Ho
Title: Low Dielectric Constant Materials for IC Applications / Edition 1, Author: Paul S. Ho
Title: Stress-Induced Phenomena in Metallization: Ninth International Workshop on Stress-Induced Phenomena in Metallization / Edition 1, Author: Shinichi Ogawa
Title: Electronic Packaging Materials Science VI: Volume 264, Author: Paul S. Ho