This liberally illustrated and fully indexed volume distils in a homogeneous, structured way the expertise of some 40 invited authors to comprehensively review the whole range of properties as well as SiGe:C, self-assembled nanostructures, quantum effects and device trends. The book contains 75% more text than Prof. Kasper's earlier book Properties of strained and relaxed SiGe (INSPEC, IEE, 1995), thoroughly updates its content and adds many new topics.
|Publisher:||Institution of Engineering and Technology (IET)|
|Product dimensions:||6.13(w) x 9.25(h) x (d)|
Table of Contents
1. Introduction; 2. Structural properties; 3. Thermal, mechanical and lattice vibrational properties; 4. Band structure; 5. Electrical and optical properties; 6. Surface properties; 7. Some device-related structures on silicon substrates: a collection of the most important data; Subject index.